ADVANCE PROGRAM & REGISTRATION FORM

 

 

 

THE HUNTSVILLE CHAPTER OF THE

IEEE EMC SOCIETY

PROUDLY PRESENTS

 

 

How To Improve The Accuracy Of EMC Measurements:

A Half-Day Technical Seminar with Demonstrations

 

 

Thursday, April 28, 2005

 

 

The Hilton Huntsville

401 Williams Avenue

Huntsville, Alabama

 

 

The Guest Speakers are from the

“Big Three in EMC” including:

Rohde & Schwarz

AR Worldwide

ETS-Lindgren

and

Ken Javor of EMC Compliance, Huntsville, Alabama


 

Program Outline

 

12:45   REGISTRATION

 

1:00     RF Conducted and Transient Disturbance Testing By Rodger Gensel, AR Worldwide This presentation will review the background of RF conducted immunity and transient disturbances such as EFT (Electrical Fast Transients), surge, ESD (Electrostatic Discharge) and power failure.  A brief look into each of the phenomena will be given and the devices which are utilized to simulate these disturbances.  An overview of the specifications behind these disturbances will also be provided.

 

Evolution of Aircraft EMC Testing: Intelligent Design or Random Chance?  By Ken Javor, EMC Compliance Topics to be addressed in include: broadband sources, instrumentation, identification and measurement and aircraft EMC testing. 

 

2:30     BREAK

 

 2:45      Anechoic Chamber Design, Rectangular Antenna Ranges: A Case Study

By Vince Rodriguez, ETS-Lindgren

Measurement of antenna patterns is becoming an important issue. Not only in defense industry but also in the fast growing wireless communications industry. The presentation reintroduces the concept of pattern and far field. The introduction of these concepts is followed by introducing different antenna ranges that can be used for pattern measurement. The concentration is then centered on direct illumination rectangular APM chambers. To illustrate, a case study is presented.

 

4:00     BREAK

 

4:15     Radiated Emissions By James Young, Rohde & Schwarz

Topics to be addressed include:  “The Spectrum Analyzer versus The EMI Receiver” (advantages and disadvantages), plus, the problems and benefits of using low noise amplifiers for increased sensitivity will be reviewed.

 

5:30-7:00 *RECEPTION WITH THE SPEAKERS *HANDS ON DEMONSTRATIONS OF THE MATERIAL PRESENTED  *DRAWING FOR PRIZES!
About the Speakers

 

Ken Javor  has worked in the field of EMC since 1980.  His aerospace EMC experience includes work on the B-52, V-22 Osprey, Air Force One, Space Shuttle Space Station and Army helicopters.  He is a member of the SAE AE-4 and EIA G-46 EMC committees specializing in the development of equipment-level EMI specifications and test methods, and in the design of test equipment and facilities.  He founded EMC Compliance in 1992, through which he provides consulting and EMC support services. Through EMCC, he has designed EMI test equipment and provided customer support for several companies in the EMI test equipment industry.  In 1993, he published “Introduction to the Control of Electromagnetic Interference, A Guide to Understanding, Applying, and Tailoring EMI Limits and Test Methods.” 

 

Rodger Gensel graduated in 1989 from Penn State University with a BSEE.  Following college, he worked for five years as an Electronics Engineer with the Naval Sea Combat Systems Engineering Station in Norfolk, VA.  He was a product manager for sonar systems that were installed on US Navy destroyers and frigates.  He then went back to school and received a Masters of Engineering Management from Old Dominion University in 1994.  For the next eight years he was a Regional Sales Manager for Dontech Inc. in Doylestown, PA.   He joined AR Worldwide in August 2002 as the EM Test product specialist.   Mr. Gensel is the technical contact/marketing specialist for the EM Test Transient Generators product line.  These generators perform testing to the various Conducted Immunity Standards/Specifications.

 

Vicente Rodríguez-Pereyra of ETS-Lindgren was born in Madrid, Spain. He obtained his BSEE from the University of Mississippi in 1994.  He joined the department of EE at the University of Mississippi as a research assistant. He was involved in projects addressing the reduction of cross talk in high-speed digital circuits and the use of the Finite Difference Time Domain technique in antenna analysis. During this time he obtained the MS and Ph.D degrees in Engineering Science with an emphasis on Electromagnetic Theory in 1996 and 1999, respectively. In August 1999, Dr. Rodriguez joined the department of Electrical Engineering and Computer Science at Texas A&M University-Kingsville as a Visiting Assistant Professor. In June 2000, Dr. Rodriguez left the academic world and joined EMC Test Systems (now ETS-Lindgren) as an RF and Electromagnetics engineer. He is the author of more than 20 technical publications. Dr. Rodriguez is a member of the IEEE and several of its technical Societies including the MTT and the EMC Societies.  He is also an active member of the Applied Computational Electromagnetic Society (ACES). Dr. Rodriguez is a full member of the Sigma Xi Scientific Research Society and of the Eta Kappa Nu Honor Society.

 

James Young is the sales and marketing manager for Rohde & Schwarz EMI products in the Americas.  His engineering background includes system, circuit, ASIC and FPGA design for various communication products.  He has also held product management and marketing positions with Cadence (Tality) in San Jose, CA, ParkerVision in Jacksonville FL, and Signal Space Design in Salt Lake City, UT.  He holds a BSEET from Weber State University and an MBA from the University of Phoenix.

 

The Program Format

The half-day will consist of a three part technical seminar.  The goal of the seminar presentations is to provide practical information for the EMC engineer, designer or technician to actually use on the job!  Following the technical seminar, a reception with the speakers will be held in a neighboring section of the hotel.  Demonstrations of the material presented will be conducted.  Participants can informally meet with the speakers and view these hands on demonstrations that are designed to “drive home” the material presented.  Heavy appetizers will be served and two drink tickets per person will be provided for the open bar.  (After that, the bar converts to a “cash bar” basis.)  A door prize drawing will be held at the conclusion of the reception.  Sponsored by the Huntsville EMC Chapter, these prizes are sure to be a winner!  Drop your business card in the bowl on the registration desk and enter to win the door prize.  You must be present to win, of course! 

 


Seminar Location

The Hilton Huntsville

401 Williams Avenue

Huntsville, AL 35801

256-533-1400

 

Acknowledgement

The Huntsville EMC Chapter is grateful for the support provided by Rohde & Schwarz, AR Worldwide, and ETS-Lindgren for providing the technical experts, equipment to support the demonstrations, and for funding the catering during the reception.

  

Registration Form

(Please Print Clearly)

Name:  _______________________________ Title:  ________________________________ Organization:  _________________________ Street Address:           Mail Stop:  ______City:   _____________ State:  _______Zip:  ______________ Daytime Phone:_________________________  E-mail address: _________________________IEEE member?  Yes  _______ No  _________

 

Please complete this registration form and mail to Michelle Gagnon, Brennan Associates, 1428-A Gulf-to-Bay Blvd., Clearwater, FL 33755, phone 727-446-5006 or fax to 407-239-6229, e-mail: sales@brennanassoc.net

 

You must complete this registration form and return it to Ms. Gagnon in order to secure your seat at this seminar.  There is no charge to attend this seminar, but a completed registration form must be on file in order to be admitted to the seminar.  Seating is limited; seating will be reserved on a first come, first served basis.  NOTE: The speakers and program may be subject to change without prior notice. 

 

The Huntsville EMC Chapter

Chairman: Paul Stover

Adtran

256-963-6099

paul.stover@adtran.com

Seminar Coordinator
 
Janet O'Neil, ETS-Lindgren

425-868-2558, j.n.oneil@ieee.org

 

Certificates of Completion from this seminar will be provided.