The American Control Conference (ACC) is an annual, 3-day event, presenting about 800 papers, with over 1200 participants from the measurement and automation communities. This premier conference and associated workshops focus on advances in the theory and practice associated with automatic control.

Topics include: industrial applications, robotics, manufacturing, guidance and flight control, power systems, process control, measurement and sensing, identification and estimation, signal processing, modelingand advanced simulation, fault detection, model validation, multivariable control, adaptive and optimal control, robustness, intelligent control, expert systems, neural nets, control engineering education, and computer aided design.

Notice that the ACC 2002 will convene in early May, 2002 instead of June, its normal time of the year. Papers are due September 15, 2001. Be sure to keep these modified dates in mind as you are making your plans to submit and attend the ACC 2002.

For more information about the 2002 ACC, please visit the web-site at http://www.ent.ohiou.edu/~acc2002/.

The conference is sponsored by the American Automatic Control Council (AACC), and topics span the scope of the 8 member societies of AACC: AIAA, AIChE , AISE , ASCE, ASME, IEEE, ISA, and SCS. The 2002 ACC is being held in cooperation with IFAC (the International Federation of Automatic Control) and SICE (the Society of Instrument and Control Engineers).