The IEEE Computer Society is providing free access to a new online tutorial, "Built-In Self-Test for Systems-on-Chip." The tutorial was delivered live at VTS 2000 (the 18th VLSI Test Symposium in Montreal in April 2000) and includes eight self-contained sections which are presented through slides that run in sync with a streaming audio voiceover. The tutorial, intended for designers, test engineers, and researchers interested in learning about BIST methods and practices for complex SOCs, is accessible without charge for a limited time - http://computer.org/DT-tutorials/BIST. The BIST tutorial is the first of several planned resources for a design and test online community, coming soon to the Computer Society's Web page.